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Project TitleStructured Illumination for the Extension of Imaging Interferometric Microscopy
Track Code2008-039
Short Description

This invention, Structured Illumination Microscopy (SIM) uses a low-Numerical Aperture (NA) microscope objective to obtain high frequency partial images using simultaneous coherent off axis illumination beams.

Abstract

This invention, Structured Illumination Microscopy (SIM) uses a low-Numerical Aperture (NA) microscope objective to obtain high frequency partial images using simultaneous coherent off axis illumination beams. Multiple calculations adjust the resultant images. This technology also provides different methods of creating the image. The benefits of this flexibility include a new option, requiring only minimal access to the objective pupil. Therefore, the invention is much more adaptable to current technology.

 
Tagslithography, microscopy
 
Posted DateFeb 16, 2011 11:39 AM

Researcher

Name
Steven Brueck
Alexander Neumann
Yuliya Kuznetsova

Manager

Name
Briana Wobbe

Background

While fluorescent microscopy has yielded some impressive results exceeding the classical diffraction limit, it remains unsuitable for certain applications. Current research still demands resolution beyond the capability of traditional non-fluorescent transmission/reflection microscopy. Previous STC.UNM Imaging Interferometric Lithography technology provides for a leap in resolution using off axis illumination and interferometric optics. This invention preserves those gains in a novel configuration and application.

Technology Description

This invention, Structured Illumination Microscopy (SIM) uses a low-Numerical Aperture (NA) microscope objective to obtain high frequency partial images using simultaneous coherent off axis illumination beams. Multiple calculations adjust the resultant images. This technology also provides different methods of creating the image. The benefits of this flexibility include a new option, requiring only minimal access to the objective pupil. Therefore, the invention is much more adaptable to current technology.

Advantages/Applications

  • Increases resolution over traditional microscopy illumination methods
  • Provides increased adaptability to current technology
  • Free of the requirements of fluorescent microscopy
  • Applicable to semiconductor manufacturing and microscopy of biological subjects

Publications

INQUIRES

STC has filed intellectual property on this exciting new technology and is currently exploring commercialization options. If you are interested in information about this or other technologies, please contact Arlene Mirabal at amirabal@stc.unm.edu or 505-272-7886.

Files

File Name Description
9,541,374 Issued Patent None Download
9,239,455 Issued Patent None Download
8,526,105 Issued Patent None Download
8,115,992 Issued Patent None Download

Intellectual Property

Patent Number Issue Date Type Country of Filing
9,541,374 Jan 10, 2017 Cont-in-Part United States
9,239,455 Jan 19, 2016 Cont-in-Part United States
8,526,105 Sep 3, 2013 Divisional United States
8,115,992 Feb 14, 2012 Utility United States